Micro-X-ray stress measurement device
Maker Rigaku
Model AutoMATE Ⅱ
Model year 2017
External Dimensions W1200 D1320 H1910
Exhibition hall Enzan Technical Center
price Price on request
Inquiry Number P20198
Mechanical Specifications
Accessories: Breaker unit, chiller (RKE750A1-RA), electrolytic polishing device, PC set, printer (B531A)
Application: Residual stress measurement for large and/or heavy objects with XRD
Method: X-ray diffraction (XRD)
2θ measurement angle: 98 to 168°
X-ray tube (A-41-Cr) (3 kW sealed type)
One-dimensional semiconductor detector (D/teX Ultra 1000)
Maximum sample size: W720 D560 H540mm
Rated tube voltage: 20 to 50 kV 2 to 50 mA
Power supply: Three-phase AC200V 50/60Hz 20A 6.9kW
XYZ stage: X-axis no Y-axis, Z-axis with manual lab jack
Weight: 1060kg
Attachments
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