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Wavelength phase difference and transmittance measuring device

Maker

Model AxoScan

Model year

External Dimensions W2000+95 D1200 H795+900

Exhibition hall Enzan Technical Center

price Price on request

Inquiry Number O40395

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Mechanical Specifications

Rapid measurement of the Mueller matrix of a sample and the optical properties of the sample are derived

Optical experiment table with stand: HA-2012-150L (Sigma Koki)

Attachments

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Everything in the factory, including devices, machines, utilities, and inspection devices, is subject to evaluation.

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