Running probe microscope
Maker Siaa Nano Technology
Model E-sweep
Model year 2006
External Dimensions
Exhibition hall Enzan Technical Center
price Price on request
Inquiry Number O20396
model e -sweep
year 2006
-> Machine specification Measurement mode: AFM/DFM
Prob Station/Unit: SPI4000/E-Sweep
Scanner used: 20UM scanners
Running area/Shape: Acutage of several nm to several um/number+nm unevenness
Eye lens WNH10X/22
Objective lens: 5x, 20x, 50x
Power: AC100V -6A 50/60Hz
PC set, turbo molecular pump set, rotary pump, anti -vibration platform attached
Attached file Operation check sheet < / / a>
※ Click on the image below to zoom in.
