Scanning Electron Microscope - JEOL JSM-IT300LA
Product Specifications
Maker JEOL
Model JSM-IT300LA
Model year 2016
External Dimensions
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number N90304
Mechanical Specifications
Magnification: x5 to x300,000
EDS detectable elements: Be to U
Sample movement method: 5 axes (X, Y, Z, R, T)
Sample movement range: X=125mm/Y=100mm/Z=WD5-48mm (focus range)/tilt=-10°-90°/rotation=360°
Vacuum pump: G-100DB x 2
Printer: SPC250L
Power supply: AC100V 50/60Hz
Attachments
※ Click on the image below to zoom in.
