Atomic force microscope (AFM)
Maker SII Sia Ainano Technology
Model L-trace Ⅱ
Model year 2012
External Dimensions 900x900x1500
Exhibition hall Kyushu Technical Center
price Price on request
Inquiry Number L70649
model l-trace Ⅱ
year 2012
-> Machine specification sample stage: φ150 (6in)
Scan method D/A converter control
Maximum voltage ± 200V
Scan rotation maximum ± 180 °
Simultaneous measurement maximum 4
AC100 1.5A 50/60Hz
添付ファイル Operation check sheet
※ Click on the image below to zoom in.
